Transaction Description:
PURPOSE: AMAG CONSULTING, LLC PROJECT WILL BE TO INCREASE THE APPLICABILITY OF SIMUSEM TO MORE CUSTOMER'S USE CASES BY ADDITION/INTEGRATION OF MESHING, CHARGING AND ROUGH SURFACE GENERATION FEATURES. THIS WILL IMPROVE PROCESS CONTROL, HYBRID METROLOGY COMPARISONS INVOLVING SEM, SEM IMAGING CONDITION OPTIMIZATION, LIMITS/FEASIBILITY STUDIES, FAUX IMAGE GENERATION FOR AI TRAINING, CALIBRATION OF ANALYTICAL MODELS, AND FUNDAMENTAL UNDERSTANDING OF SIGNAL GENERATION, ALL CRITICAL FOR SUCCESSFUL METROLOGY OF FUTURE SHRINKING DEVICES.ACTIVITIES TO BE PERFORMED: DURING PHASE I, A CHARGING MODEL WILL BE IMPLEMENTED IN SIMUSEM WITH AN INCLUSION OF CHARGING MODEL AND ROUGH SURFACE CAPABILITIES NECESSARY FOR ACCURATE SIMULATION OF PERTINENT DIELECTRIC MATERIALS WHICH CHARGE UNDER SEM.EXPECTED OUTCOMES: TECHNOLOGY DEVELOPMENT UNDER THIS PHASE I WILL RESULT IN IMPROVING PROCESS CONTROL, HYBRID METROLOGY COMPARISONS INVOLVING SEM, SEM IMAGING CONDITION OPTIMIZATION, LIMITS/FEASIBILITY STUDIES, FAUX IMAGE GENERATION FOR AI TRAINING, CALIBRATION OF ANALYTICAL MODELS, AND FUNDAMENTAL UNDERSTANDING OF SIGNAL GENERATION, ALL CRITICAL FOR SUCCESSFUL METROLOGY OF FUTURE SHRINKING DEVICES.INTENDED BENEFICIARIES: THE AWARDEE'S INTENDED BENEFICIARIES ARE THE SEMICONDUCTOR INDUSTRY. THEY WILL BE ABLE TO REFINE SEM METROLOGY OF SMALLER, MORE ENERGY-EFFICIENT CHIPS FOR COMMERCIAL ELECTRONICS. ACCURATE/PRECISE SEM METROLOGY IS CRUCIAL FOR CORRECTLY UNDERSTANDING AND TIGHTENING PRODUCED FEATURE SIZE DISTRIBUTIONS FOR PROCESS CONTROL OR DEFECTIVITY FOR THE BILLIONS OF ON-CHIP TRANSISTORS.SUBRECIPIENT ACTIVITIES: A CONSULTANT WILL BE USED IN PHASE I THAT HAS EXPERTISE IN IMPROVING SPEED BY MULTI-THREADING AND DISTRIBUTED PROCESSING AND ALSO DEVELOPING SOFTWARE INSTALLATION SYSTEMS.
